MS-Journal Papers(저널논문)

Recent Items

Collection's Items (Sorted by Submit Date in Descending order): 4401 to 4420 of 7245

4401
GaAs (001) 기판위에 분자선 에피텍시 방법으로 성장시킨 CdxZn1-x Te 에피층에서의 CuPt형 규칙상에 대한 고찰

이호성; 이정용; 김태환; 권명석; 박홍이, 대한금속·재료학회지, v.42, no.12, pp.1029 - 1033, 2004-12

4402
Effect of annealing on the microstructural and optical properties of InAs quantum dots grown on GaAs buffer layers

Lee, KH; Lee, HS; Lee, JeongYong; Lee, DU; Kim, TW; Kim, MD, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.45, pp.S799 - S802, 2004-12

4403
Sn-Bi 합금도금층의 미세조직에 미치는 도금변수의 영향 및 Sn-Bi/Cu 계면에서의 금속간 화합물의 성장

박찬진; 권혁상; 서민석, 대한금속·재료학회지, v.40, no.1, pp.74 - 82, 2002-01

4404
In situ study of the continuous cooling transformation behaviour of Ti-Al alloys within the two-phase (alpha+gamma) region

Kim, JS; Park, Joong Keun; Chun, CH; Kim, GH, PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, v.81, no.9, pp.2095 - 2107, 2001-09

4405
Numerical simulations and measurements of temperature and stress field in medium-high carbon steel specimen after hard-face-welding

Yang, QX; Yao, M; Park, Joong Keun, COMPUTATIONAL MATERIALS SCIENCE, v.29, no.1, pp.37 - 42, 2004-01

4406
Phase evolution in aluminum nitride thin films on Si(100) prepared by radio frequency magnetron sputtering

Choi, JH; Lee, JeongYong; Kim, JH, THIN SOLID FILMS, v.384, no.2, pp.166 - 172, 2001-03

4407
Domain formation in epitaxial Pb(Zr,Ti)O-3 thin films

Lee, KS; Choi, JH; Lee, JeongYong; Baik, S, JOURNAL OF APPLIED PHYSICS, v.90, no.8, pp.4095 - 4102, 2001-10

4408
Existence and atomic arrangement of the CuPt-type ordered structure near the ZnTe/GaAs heterointerface due to residual impurities

Lee, HS; Lee, JeongYong; Kim, TW; Lee, DU; Choo, DC; Park, HL, JOURNAL OF APPLIED PHYSICS, v.90, no.8, pp.4027 - 4031, 2001-10

4409
Influence of Mg doping on structural defects in AlGaN layers grown by metalorganic chemical vapor deposition

Cho, HK; Lee, JeongYong; Jeon, SR; Yang, GM, APPLIED PHYSICS LETTERS, v.79, no.23, pp.3788 - 3790, 2001-12

4410
Effects of stress on the microstructure of the corner defect in As+-implanted, two-dimensional amorphized Si

Shin, YG; Lee, JeongYong; Park, MH; Kang, HK, JOURNAL OF CRYSTAL GROWTH, v.233, no.4, pp.673 - 680, 2001-12

4411
Effect of buffer layers and stacking faults on the reduction of threading dislocation density in GaN overlayers grown by metalorganic chemical vapor deposition

Cho, HK; Lee, JeongYong; Kim, KS; Yang, GM; Song, JH; Yu, PW, JOURNAL OF APPLIED PHYSICS, v.89, no.5, pp.2617 - 2621, 2001-03

4412
Strain effects and atomic arrangements of 60 degrees and 90 degrees dislocations near the ZnTe/GaAs heterointerface

Kim, TW; Lee, DU; Lee, HS; Lee, JeongYong; Park, HL, APPLIED PHYSICS LETTERS, v.78, no.10, pp.1409 - 1411, 2001-03

4413
Effects of post-annealing on the interface microstructure of (Ba,Sr)TiO3 thin films

Yoo, DC; Lee, JeongYong, JOURNAL OF CRYSTAL GROWTH, v.224, no.3-4, pp.251 - 255, 2001-04

4414
Microstructural and interband transition studies of multiple stacked layers of Si-doped InAs self-assembled quantum dot arrays inserted into GaAs barriers

Kim, TW; Lee, DU; Choo, DC; Kim, HJ; Lee, HS; Lee, JeongYong; Kim, MD; et al, SOLID STATE COMMUNICATIONS, v.118, no.9, pp.465 - 468, 2001-05

4415
Microstructural and optical properties of InAs/GaAs quantum dots embedded in modulation-doped AlxGa1-xAs/GaAs heterostructures

Lee, HS; Lee, JeongYong; Kim, TW; Lee, DU; Choo, DC; Jung, M; Kim, MD, JOURNAL OF APPLIED PHYSICS, v.91, no.8, pp.5195 - 5199, 2002-04

4416
Dry Film Photoresist를 이용한 테프론 PCB 위 미세 피치 솔더 범프 형성

주건모; 전덕영; 이정섭, 마이크로전자 및 패키징학회지, v.11, no.1, pp.21 - 28, 2004-03

4417
Existence of a CuAu-I-type ordered structure in lattice-mismatched InxGa1-xAs/InyAl1-yAs multiple quantum wells

Kim, TW; Lee, DU; Lee, HS; Lee, JeongYong; Kim, MD, JOURNAL OF APPLIED PHYSICS, v.89, no.4, pp.2503 - 2505, 2001-02

4418
Microstructural characterization of InGaN/GaN multiple quantum wells with high indium composition

Cho, HK; Lee, JeongYong; Kim, CS; Yang, GM; Sharma, N; Humphreys, C, JOURNAL OF CRYSTAL GROWTH, v.231, no.4, pp.466 - 473, 2001-11

4419
Nanostructured silicon formations as a result of ionized N-2 gas reactions on silicon with native oxide layers

Jung, MC; Lee, TG; Park, YJ; Jun, SH; Lee, J; Han, M; Jeong, JS; et al, APPLIED PHYSICS LETTERS, v.82, pp.3653 - 3655, 2003-05

4420
Strain relaxation behavior of the InGaN/GaN multiple quantum wells observed by transmission electron microscopy

Cho, HK; Lee, JeongYong; Leem, JY, APPLIED SURFACE SCIENCE, v.221, pp.288 - 292, 2004-01

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