Browse "MS-Journal Papers(저널논문)" by Author S.-H. Suh
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| A High-Resolution Transmission Electron Microscopy Study of Defects in (001) CdTe/(001) GaAs M.S. Kwon; J.Y Lee; W.J. Sohng; S.-H. Suh, KOREAN APPLIED PHYSICS, v.7, no.4, pp.266 - 271, 1994-12 |
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