A High-Resolution Transmission Electron Microscopy Study of Defects in (001) CdTe/(001) GaAs
- Publisher
- 한국물리학회
- Issue Date
- 1994-12
- Language
- Korean
- Citation
KOREAN APPLIED PHYSICS, v.7, no.4, pp.266 - 271
- Appears in Collection
- MS-Journal Papers(저널논문)
- Files in This Item
- There are no files associated with this item.
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