Browse "MS-Journal Papers(저널논문)" by Author Roh, Yong-Suk
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| Influence of gate dielectric/channel interface engineering on the stability of amorphous indium gallium zinc oxide thin-film transistors Cho, Sung Haeng; Ryu, Min Ki; Kim, Hee-Ok; Kwon, Oh-Sang; Park, Eun-Sook; Roh, Yong-Suk; Hwang, Chi-Sun; et al, PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, v.211, no.9, pp.2126 - 2133, 2014-09 |
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