Browse "MS-Journal Papers(저널논문)" by Author Park, JH
Showing results 1 to 16 of 16
| Characterization of elastic moduli of Cu thin films using nanoindentation technique Hong, Soon-Hyung; Kim, KS; Kim, YM; Hahn, JH; Lee, CS; Park, JH, COMPOSITES SCIENCE AND TECHNOLOGY, v.65, pp.1401 - 1408, 2005-07 |
| Effects of interfacial states on electrical properties of SrBi2Ta2O9 thin films Choi, GP; Park, JH; Lee, CH; Kim, Il-Doo; Kim, Ho Gi, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.39, no.9A, pp.5151 - 5155, 2000-09 |
| Electrical properties of PZT thin films deposited on LSCO electrodes Kim, Il-Doo; Choi, WY; Choi, GP; Park, JH; Lee, CH; Kim, Ho Gi; Noh, TH; et al, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.35, pp.500 - 2, 1999-07 |
| Electromigration model for the prediction of lifetime based on the failure unit statistics in aluminum metallization Park, JH; Ahn, Byung Tae, JOURNAL OF APPLIED PHYSICS, v.93, no.2, pp.883 - 892, 2003-01 |
| Enhanced hardness in two-layer a-BON/nc-SiC coating prepared by plasma-assisted MOCVD and thermal MOCVD Lim, DC; Kang, BC; Moon, JS; Moon, OM; Park, JH; Jee, HG; Lee, SB; et al, SURFACE & COATINGS TECHNOLOGY, v.193, pp.162 - 166, 2005-04 |
| Epitaxial growth of CoSi2 layer on a Si(100) substrate using a CoNx interlayer deposited by reactive sputtering Kim, SI; Lee, SR; Park, JH; Ahn, Byung Tae, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.153, no.5, pp.506 - 510, 2006 |
| Epitaxial growth of CoSi2 on si using a CoNx interlayer deposited by reactive metallorganic chemical vapor deposition Kim, SI; Lee, SR; Park, JH; Ahn, Byung Tae, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.8, no.11, pp.324 - 326, 2005 |
| Evaluation method of longitudinal and transverse piezoelectric d-coefficients for thin films Kim, DG; Kim, Il-Doo; Lee, CH; Park, JH; Choi, KP; Kim, Ho Gi, INTEGRATED FERROELECTRICS, v.35, no.1-4, pp.2029 - 2042, 2001 |
| Large area synthesis of 1-D ZnO nanostructure arrays on Zn substrate via solvothermal process Park, JH; Choi, HG; Kim, JH; Kim, Do Kyung, DIFFUSTION AND DEFECT DATA PT.B: SOLID STATE PHENOMENA, v.124-126, no.PART 2, pp.1169 - 1172, 2007 |
| Preparation and characterization of lead germanate (Pb5Ge3O11) thin film by pulsed laser deposition Park, JH; Kim, DG; Kim, Il-Doo; Lee, CH; Kim, Ho Gi, INTEGRATED FERROELECTRICS, v.36, no.1-4, pp.93 - 100, 2001 |
| Stress effect on the tuning properties of Ba0.5Sr0.5TiO3 thin films Kim, Il-Doo; Park, JH; Kim, Ho Gi, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.5, no.7, pp.18 - 21, 2002-07 |
| STRUCTURAL AND OPTICAL-PROPERTIES OF HYDROGENATED AMORPHOUS-SILICON CARBIDE DEPOSITED BY GLOW-DISCHARGE FROM C3H8-SIH4-H2 MIXTURE Park, JH; Kwon, Hyuk-Sang; Lee, JY, JOURNAL OF APPLIED PHYSICS, v.72, no.11, pp.5246 - 5252, 1992-12 |
| The effect of processing parameter on the piezoelectric d-coefficients of PZT thin films Kim, DG; Kim, Il-Doo; Lee, CH; Park, JH; Kim, Ho Gi, FERROELECTRICS, v.263, no.1-4, pp.1327 - 1332, 2001 |
| Thermal stability of RuO2-based bottom electrodes during various ambient annealings Ahn, JH; Park, JH; Choi, GP; Choi, WY; Kim, Ho Gi; Lee, WJ; Yoon, SG, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.35, pp.S491 - S495, 1999-07 |
| Time dependence of electrical properties of SrBi2Ta2O9 thin films after top electrode annealing Choi, GP; Park, JH; Lee, CH; Kim, Il-Doo; Kim, Ho Gi, MATERIALS LETTERS, v.45, no.3-4, pp.208 - 212, 2000-09 |
| Time-zero failure current measurement for early monitoring of defective metal lines at wafer level Park, JH; Ahn, Byung Tae, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.150, no.1, pp.6 - 9, 2003-01 |
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