Showing results 1 to 6 of 6
Fabrication of one-dimensional and two-dimensional periodically polarity inverted ZnO structures using the patterned CrN buffer layers Park, JS; Minegishi, T; Lee, SH; Im, IH; Park, SH; Goto, T; Cho, MW; et al, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.27, pp.1658 - 1661, 2009-05 |
Ferroelectric properties of lead-free (Bi,La)(4)Ti3O12 thin film deposited on MTP cell structure for high density FeRAM device Cho, KW; Kim, NK; Oh, SH; Choi, ES; Sun, HJ; Yeom, SJ; Lee, KN; et al, ECO-MATERIALS PROCESSING DESIGN VI BOOK SERIES: MATERIALS SCIENCE FORUM, v.486-487, pp.285 - 288, 2005 |
Polarity control of ZnO films on (0001) Al2O3 by Cr-compound intermediate layers Park, JS; Hong, SK; Minegishi, T; Park, SH; Im, IH; Hanada, T; Cho, MW; et al, APPLIED PHYSICS LETTERS, v.90, no.20, pp.173 - 190, 2007-05 |
Pre-annealing effects on al metallization properties in high density FeRAM device Cho, KW; Choi, JH; Yu, HS; Kweon, SY; Yeom, SJ; Kim, NK; Choi, ES; et al, INTEGRATED FERROELECTRICS, v.81, pp.113 - 122, 2006 |
Structural and optical properties of non-polar A-plane ZnO films grown on R-plane sapphire substrates by plasma-assisted molecular-beam epitaxy Han, SK; Hong, SK; Lee, JW; Lee, JeongYong; Song, JH; Nam, YS; Chang, SK; et al, JOURNAL OF CRYSTAL GROWTH, v.309, no.2, pp.121 - 127, 2007-12 |
Structural investigation of nitrided c-sapphire substrate by grazing incidence x-ray diffraction and transmission electron microscopy Lee, HJ; Ha, JS; Lee, SW; Goto, H; Lee, SH; Cho, MW; Yao, T; et al, APPLIED PHYSICS LETTERS, v.91, pp.892 - 899, 2007-11 |
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