Showing results 1 to 7 of 7
Fabrication of atomic force microscope probe with low spring constant using SU-8 photoresist Lee, J; Shin, H; Kim, S; Hong, S; Chung, J; Park, H; Moon, J, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.42, no.10A, pp.L1171 - L1174, 2003-10 |
Read/write mechanisms and data storage system using atomic force microscopy and MEMS technology Shin, H; Hong, S; Moon, J; Jeon, JU, ULTRAMICROSCOPY, v.91, no.1-4, pp.103 - 110, 2002-05 |
Scanning resistive probe microscopy: Imaging ferroelectric domains Park, H; Jung, J; Min, DK; Kim, S; Hong, S; Shin, H, APPLIED PHYSICS LETTERS, v.84, no.10, pp.1734 - 1736, 2004-03 |
Servo and tracking algorithm for a probe storage system Min, DK; Hong, S, IEEE TRANSACTIONS ON MAGNETICS, v.41, no.2, pp.855 - 859, 2005-02 |
Three-dimensional ferroelectric domain imaging of bulk Pb(Zr,Ti)O-3 by atomic force microscopy Hong, S; Ecabart, B; Colla, EL; Setter, N, APPLIED PHYSICS LETTERS, v.84, no.13, pp.2382 - 2384, 2004-03 |
Tribological characteristics of probe tip and PZT media for AFM-based recording technology Chung, KH; Lee, YH; Kim, DE; Yoo, J; Hong, S, IEEE TRANSACTIONS ON MAGNETICS, v.41, no.2, pp.849 - 854, 2005-02 |
Unusual size effect on the polarization patterns in micron-size Pb(Zr,Ti)O-3 film capacitors Stolichnov, I; Colla, E; Tagantsev, A; Bharadwaja, SSN; Hong, S; Setter, N; Cross, JS; et al, APPLIED PHYSICS LETTERS, v.80, no.25, pp.4804 - 4806, 2002-06 |
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