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Ferroelectric Domain Wall Motion in Freestanding Single-Crystal Complex Oxide Thin Film Bakaul, Saidur R.; Kim, Jaegyu; Hong, Seungbum; Cherukara, Mathew J.; Zhou, Tao; Stan, Liliana; Serrao, Claudy R.; et al, ADVANCED MATERIALS, v.32, no.4, 2020-01 |
Quantitative Observation of Threshold Defect Behavior in Memristive Devices with Operando X-ray Microscopy Liu, Huajun; Dong, Yongqi; Cherukara, Mathew J.; Sasikumar, Kiran; Narayanan, Badri; Cai, Zhonghou; Lai, Barry; et al, ACS NANO, v.12, no.5, pp.4938 - 4945, 2018-05 |
Screening mechanisms at polar oxide heterointerfaces Hong, Daniel Seungbum; Nakhmanson, Serge M.; Fong, Dillon D., REPORTS ON PROGRESS IN PHYSICS, v.79, no.7, 2016-07 |
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