Screening mechanisms at polar oxide heterointerfaces

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The interfaces of polar oxide heterostructures can display electronic properties unique from the oxides they border, as they require screening from either internal or external sources of charge. The screening mechanism depends on a variety of factors, including the band structure at the interface, the presence of point defects or adsorbates, whether or not the oxide is ferroelectric, and whether or not an external field is applied. In this review, we discuss both theoretical and experimental aspects of different screening mechanisms, giving special emphasis to ways in which the mechanism can be altered to provide novel or tunable functionalities. We begin with a theoretical introduction to the problem and highlight recent progress in understanding the impact of point defects on polar interfaces. Different case studies are then discussed, for both the high thickness regime, where interfaces must be screened and each interface can be considered separately, and the low thickness regime, where the degree and nature of screening can be manipulated and the interfaces are close enough to interact. We end with a brief outlook toward new developments in this rapidly progressing field
Publisher
IOP PUBLISHING LTD
Issue Date
2016-07
Language
English
Article Type
Review
Citation

REPORTS ON PROGRESS IN PHYSICS, v.79, no.7

ISSN
0034-4885
DOI
10.1088/0034-4885/79/7/076501
URI
http://hdl.handle.net/10203/213901
Appears in Collection
MS-Journal Papers(저널논문)
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