Browse "MS-Journal Papers(저널논문)" by Author Lee, W. J.
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| XPS sputter depth profiling of the chemical states for SrTiO3/Si interface by O-2(+) ion beams Kim, K. J.; Moon, D. W.; Nam. S. H.; Lee, W. J.; Kim, Ho Gi, SURFACE INTERFACE ANALYSIS, v.23, no.13, pp.851 - 857, 1995-12 |
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