Results 11-12 of 12 (Search time: 0.007 seconds).
NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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Atomic-Resolution Imaging of the Nanoscale Origin of Toughness in Rare-Earth Doped SiC Kueck, Aaron M.; Kim, Do Kyung; Ramasse, Quentin M.; Jonghe, L. C. De; Ritchie, R. O., 2011-04-29 | |
Vertical Single-Walled Carbon Nanotube Arrays via Block Copolymer Lithography Lee, Duck Hyun; Lee, Won Jong; Kim, Sang Ouk, Chemistry of Materials, Vol.21, pp.1368-1374, 2009 |
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