Browse "IE-Journal Papers(저널논문)" by Subject tardiness
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| Production scheduling in a semiconductor wafer fabrication facility producing multiple product types with distinct due dates Kim, Yeong-Dae; Kim, JG; Kim, HU, IEEE TRANSACTIONS ON ROBOTICS AND AUTOMATION, v.17, no.5, pp.589 - 598, 2001-10 |
| Scheduling in a Two-machine Flowshop with Batch Processing Machine(s) for Earliness/Tardiness Measure under a Common Due Date Sung, Chang Sup; Min, JI, EUROPEAN JOURNAL OF OPERATIONAL RESEARCH, v.131, no.1, pp.95 - 106, 2001-05 |
| Scheduling Wafer Lots on Diffusion Machines in a Semiconductor Wafer Fabrication Facility Kim, Yeong-Dae; Joo, BJ; Choi, SY, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.23, pp.246 - 254, 2010-05 |
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