Browse "IE-Journal Papers(저널논문)" by Title 

Showing results 1541 to 1560 of 2086

1541
Self-adaptive and dynamic clustering for online anomaly detection

Lee, Seung-Min; Kim, Gi-Sung; Kim, Se-Hun, EXPERT SYSTEMS WITH APPLICATIONS, v.38, no.12, pp.14891 - 14898, 2011

1542
Self-intersection removal in triangular mesh offsetting

Jung, W; Shin, Hayong; Choi, B.K, COMPUTER-AIDED DESIGN AND APPLICATIONS, v.1, no.1-4, pp.477 - 484, 2004

1543
Self-supervised graph representation learning via positive mining

Lee, Namkyeong; Lee, Junseok; Park, Chanyoung, INFORMATION SCIENCES, v.611, pp.476 - 493, 2022-09

1544
Semantic relation based personalized ranking approach for engineering document retrieval

Hahm, Gyeong June; Lee, Jae Hyun; Suh, Hyo Won, ADVANCED ENGINEERING INFORMATICS, v.29, no.3, pp.366 - 379, 2015-08

1545
Semi-Supervised Learning for Simultaneous Location Detection and Classification of Mixed-Type Defect Patterns in Wafer Bin Maps

Lee, Hyuck; Lee, Jaehyun; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.36, no.2, pp.220 - 230, 2023-05

1546
Semi-Supervised Multi-Label Learning for Classification of Wafer Bin Maps With Mixed-Type Defect Patterns

Lee, Hyuck; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.33, no.4, pp.653 - 662, 2020-11

1547
Semiconductor FAB layout design analysis with 300-mm FAB data: "Is minimum distance-based layout design best for semiconductor FAB design?"

Kim, Junghoon; Yu, Gwangjae; Jang, Young Jae, COMPUTERS INDUSTRIAL ENGINEERING, v.99, pp.330 - 346, 2016-09

1548
Semiconductor manufacturing intelligence and automation Foreward

Chien, Chen-Fu; Hsu, Chia-Yu; Morrison, James R; Dou, Runliang, COMPUTERS & INDUSTRIAL ENGINEERING, v.99, pp.315 - 317, 2016-09

1549
Sensitivity of wardrop equilibria: revisited

Takalloo, Mahdi; Kwon, Changhyun, OPTIMIZATION LETTERS, v.14, no.3, pp.781 - 796, 2020-04

1550
Sequence-order-independent network profiling for detecting application layer DDoS attacks

Lee, Sang-Jae; Kim, Gi-Sung; Kim, Se-Hun, EURASIP JOURNAL ON WIRELESS COMMUNICATIONS AND NETWORKING, v.2011, no.50, 2011-08

1551
Sequencing delivery and receiving operations for yard cranes in port container terminals

Kim, Kap-Hwan; Lee, Keung-Mo; Hwang, Hark, INTERNATIONAL JOURNAL OF PRODUCTION ECONOMICS, v.84, no.3, pp.283 - 292, 2003-06

1552
Sequencing for a Mixed Model Assembly Line in Just-In-Time Production System

황학, KOREAN MANAGEMENT SCIENCE REVIEW, v.11, no.1, 1994-01

1553
SEQUENCING PICKING OPERATIONS AND TRAVEL TIME MODELS FOR MAN-ON-BOARD STORAGE AND RETRIEVAL WAREHOUSING SYSTEM

Hwang, Hark; jin-young song, INTERNATIONAL JOURNAL OF PRODUCTION ECONOMICS, v.29, no.1, pp.75 - 88, 1993

1554
Sequential Likelihood-Free Inference with Neural Proposal

Kim, Dongjun; Song, Kyungwoo; Kim, Yoon-Yeong; Shin, Yongjin; Kang, Wanmo; Moon, Il-Chul; Joo, Weonyoung, PATTERN RECOGNITION LETTERS, v.169, pp.102 - 109, 2023-05

1555
Server unavailability reduces mean waiting time in some batch service queuing systems

Lee, HW; Chung, DI; Lee, SS; Chae, Kyung-Chul, COMPUTERS OPERATIONS RESEARCH, v.24, no.6, pp.559 - 567, 1997-06

1556
SETUP COST REDUCTION IN A DYNAMIC LOT-SIZE MODEL WITH MULTIPLE FINITE PRODUCTION-RATES

Sung, Chang Sup, ENGINEERING OPTIMIZATION, v.24, no.1, pp.19 - 37, 1995

1557
SEX-DIFFERENCES IN ANTHROPOMETRY FOR SCHOOL FURNITURE DESIGN

JEONG, BY; Park, Kyung Soo, ERGONOMICS, v.33, no.12, pp.1511 - 1521, 1990-12

1558
Simple Enumeration of Minimal Cutsets Separating 2 Vertices in a Class of Undirected Planar Graphs

Sung, Chang Sup, IEEE TRANSACTIONS ON RELIABILITY, v.41, no.1, pp.63 - 71, 1992-01

1559
Simplification methods for accelerating simulation-based real-time scheduling in a semiconductor wafer fabrication facility

Kim, Yeong-Dae; Shim, SO; Choi, B; Hwang, Hark, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.16, pp.290 - 298, 2003-05

1560
Simulated annealing algorithms for locating pickup and delivery points in an automated guided vehicle system

Kim, Jae-Gon; Kim, Yeong-Dae; Lee, Dong-Ho, JOURNAL OF ENGINEERING VALUATION AND COST ANALYSIS, v.3, no.4-5, pp.205 - 215, 2000

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