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Development of thermography based technique for automated detection and classification of defects in semiconductor lead frame

Chung, Jun yeon; Sohn, Hoon; Kim, Chisung; Yi, Kiyoon; Park, Juneho; Ramos, Oliver, 2020 Digital Thermography Workshop of Korean Society of Nondestructive Testing, Korean Society of Nondestructive Testing, 2020-08-14

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