Development of thermography based technique for automated detection and classification of defects in semiconductor lead frame

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Publisher
Korean Society of Nondestructive Testing
Issue Date
2020-08-14
Language
English
Citation

2020 Digital Thermography Workshop of Korean Society of Nondestructive Testing

URI
http://hdl.handle.net/10203/280164
Appears in Collection
CE-Conference Papers(학술회의논문)
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