Showing results 1 to 6 of 6
Combined structural refinement and spontaneous polarization study of Bi(3.5)Ce(0.5)Ti(3)O(12) by using x-ray and neutron powder diffraction data Jeon, Min Ku; Kim, Yong-Il; Nahm, Seung-Hoon; Jung, Chang Hwa; Woo, Seong-Ihl, JOURNAL OF PHYSICS D-APPLIED PHYSICS, v.41, no.8, 2008-04 |
Combined structural refinement of Bi3.5La0.5Ti3O12 using neutron and X-ray powder diffraction data Jeon, MK; Kim, YI; Nahm, SH; Woo, Seong-Ihl, JOURNAL OF PHYSICAL CHEMISTRY B, v.109, no.2, pp.968 - 972, 2005-01 |
Ferroelectric properties of Bi(4-x)Ce(x)Ti(3)O(12) (0 < x < 4) thin film array fabricated from Bi(2)O(3)/CeO(2)/TiO(2) multilayers using multitarget sputtering Kim, Ki-Woong; Kim, Tai-Suk; Jeon, Min-Ku; Oh, Kwang-Seok; Jung, Chang-Hwa; Woo, Seong-Ihl, APPLIED PHYSICS LETTERS, v.92, no.5, 2008-02 |
Ferroelectric properties of Bi3.25Ce0.75Ti3O12 thin films prepared by a liquid source misted chemical deposition Jeon, MK; Chung, HJ; Kim, KW; Oh, KS; Woo, Seong-Ihl, THIN SOLID FILMS, v.489, no.1-2, pp.1 - 4, 2005-10 |
Quantitative structure-property relationship in a combinatorial Bi4-xLaxTi3O12 (0 <= x <= 1) thin film array obtained with microbeam XRD and Raman Spectroscopy Kim, Ki Woong; Jeon, Min Ku; Kim, Tai Suk; Oh, Kwang Seok; Shin, Joong-Won; Woo, Seong-Ihl, JOURNAL OF COMBINATORIAL CHEMISTRY, v.9, no.5, pp.823 - 827, 2007 |
Structure analysis of ferroelectric Bi4Ti3O12 by using X-ray powder diffraction Jeon, MK; Woo, Seong-Ihl; Kim, YI; Nahm, SH, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.45, no.5, pp.1240 - 1243, 2004-11 |
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