Effects of Annealing Temperature on Microstructure and Electrical and Optical Properties of Radio-Frequency-Sputtered Tin-Doped Indium Oxide Films
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | jong-gab na | ko |
| dc.contributor.author | young-rae cho | ko |
| dc.contributor.author | young-ho kim | ko |
| dc.contributor.author | soon-ja park | ko |
| dc.contributor.author | Lee, Taek Dong | ko |
| dc.date.accessioned | 2013-02-25T00:08:52Z | - |
| dc.date.available | 2013-02-25T00:08:52Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1989-04 | - |
| dc.identifier.citation | JOURNAL OF THE AMERICAN CERAMIC SOCIETY, v.72, no.4, pp.698 - 701 | - |
| dc.identifier.issn | 0002-7820 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/58292 | - |
| dc.language | English | - |
| dc.publisher | Wiley-Blackwell | - |
| dc.title | Effects of Annealing Temperature on Microstructure and Electrical and Optical Properties of Radio-Frequency-Sputtered Tin-Doped Indium Oxide Films | - |
| dc.type | Article | - |
| dc.identifier.wosid | A1989AP17400031 | - |
| dc.identifier.scopusid | 2-s2.0-0024640718 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 72 | - |
| dc.citation.issue | 4 | - |
| dc.citation.beginningpage | 698 | - |
| dc.citation.endingpage | 701 | - |
| dc.citation.publicationname | JOURNAL OF THE AMERICAN CERAMIC SOCIETY | - |
| dc.contributor.localauthor | Lee, Taek Dong | - |
| dc.contributor.nonIdAuthor | jong-gab na | - |
| dc.contributor.nonIdAuthor | young-rae cho | - |
| dc.contributor.nonIdAuthor | young-ho kim | - |
| dc.contributor.nonIdAuthor | soon-ja park | - |
| dc.type.journalArticle | Article | - |
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