DC Field | Value | Language |
---|---|---|
dc.contributor.author | J.S. Park | ko |
dc.contributor.author | Kim, Ho Gi | ko |
dc.date.accessioned | 2013-02-24T14:16:48Z | - |
dc.date.available | 2013-02-24T14:16:48Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1989-01 | - |
dc.identifier.citation | JOURNAL OF APPLIED PHYSICS, v.65, no.2, pp.877 - 879 | - |
dc.identifier.issn | 0021-8979 | - |
dc.identifier.uri | http://hdl.handle.net/10203/57775 | - |
dc.language | English | - |
dc.publisher | Amer Inst Physics | - |
dc.title | Thermal Analysis of the Bi-Sr-Ca-Cu-O System by an Electrical Property | - |
dc.type | Article | - |
dc.identifier.wosid | A1989R720400077 | - |
dc.identifier.scopusid | 2-s2.0-36549096594 | - |
dc.type.rims | ART | - |
dc.citation.volume | 65 | - |
dc.citation.issue | 2 | - |
dc.citation.beginningpage | 877 | - |
dc.citation.endingpage | 879 | - |
dc.citation.publicationname | JOURNAL OF APPLIED PHYSICS | - |
dc.contributor.localauthor | Kim, Ho Gi | - |
dc.contributor.nonIdAuthor | J.S. Park | - |
dc.type.journalArticle | Note | - |
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