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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Journal Papers(저널논문)

A NEW INTERPRETATION OF END RESISTANCE MEASUREMENTS

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Lee, Kwyroresearcher / SHUR, M / LEE, KW / VU, T / ROBERTS, P / HELIX, M
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Issue Date
1984
Language
English
Article Type
Article
Citation

IEEE ELECTRON DEVICE LETTERS, v.5, no.1, pp.5 - 7

ISSN
0741-3106
DOI
10.1109/EDL.1984.25810
URI
http://hdl.handle.net/10203/56969
Appears in Collection
EE-Journal Papers(저널논문)
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