A NEW INTERPRETATION OF END RESISTANCE MEASUREMENTS
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Kwyro | ko |
| dc.contributor.author | SHUR, M | ko |
| dc.contributor.author | LEE, KW | ko |
| dc.contributor.author | VU, T | ko |
| dc.contributor.author | ROBERTS, P | ko |
| dc.contributor.author | HELIX, M | ko |
| dc.date.accessioned | 2013-02-24T11:56:00Z | - |
| dc.date.available | 2013-02-24T11:56:00Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1984 | - |
| dc.identifier.citation | IEEE ELECTRON DEVICE LETTERS, v.5, no.1, pp.5 - 7 | - |
| dc.identifier.issn | 0741-3106 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/56969 | - |
| dc.language | English | - |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
| dc.title | A NEW INTERPRETATION OF END RESISTANCE MEASUREMENTS | - |
| dc.type | Article | - |
| dc.identifier.wosid | A1984RZ62300003 | - |
| dc.identifier.scopusid | 2-s2.0-0021166505 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 5 | - |
| dc.citation.issue | 1 | - |
| dc.citation.beginningpage | 5 | - |
| dc.citation.endingpage | 7 | - |
| dc.citation.publicationname | IEEE ELECTRON DEVICE LETTERS | - |
| dc.identifier.doi | 10.1109/EDL.1984.25810 | - |
| dc.contributor.localauthor | Lee, Kwyro | - |
| dc.contributor.nonIdAuthor | SHUR, M | - |
| dc.contributor.nonIdAuthor | LEE, KW | - |
| dc.contributor.nonIdAuthor | VU, T | - |
| dc.contributor.nonIdAuthor | ROBERTS, P | - |
| dc.contributor.nonIdAuthor | HELIX, M | - |
| dc.type.journalArticle | Article | - |
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