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Showing results 5 to 11 of 11

5
LCD panel characterization by measuring full Jones matrix of individual pixels using polarization-sensitive digital holographic microscopy

Park, Jongchan; Yu, Hyeonseung; Park, Jung-Hoon; Park, YongKeun, OPTICS EXPRESS, v.22, no.20, pp.24304 - 24311, 2014-10

6
Roadmap on Digital Holography-Based Quantitative Phase Imaging

Balasubramani, Vinoth; Kujawinska, Malgorzata; Allier, Cedric; Anand, Vijayakumar; Cheng, Chau-Jern; Depeursinge, Christian; Hai, Nathaniel; et al, JOURNAL OF IMAGING, v.7, no.12, 2021-12

7
Thickness-dependent topological domain textures of layered ferroelectric Bi2WO6 thin films

Kwon, Yong-Jun; Yang, Chan-Ho, APPLIED PHYSICS LETTERS, v.124, no.21, 2024-05

8
Three-dimensional Refractive-index Distributions of Individual Angiosperm Pollen Grains

Park, Chansuk; Lee, SangYun; Kim, Geon; Lee, SeungJun; Lee, Jaehoon; Heo, Taehyun; Park, Yoonjeong; et al, CURRENT OPTICS AND PHOTONICS, v.2, no.5, pp.460 - 467, 2018-10

9
Time-multiplexed structured illumination using a DMD for optical diffraction tomography

Lee, Kyeo Reh; Kim, Kyoohyun; Kim, Geon; Shin, Seungwoo; Park, Yongkeun, OPTICS LETTERS, v.42, no.5, pp.999 - 1002, 2017-03

10
Tomographic measurement of dielectric tensors at optical frequency

Shin, Seungwoo; Eun, Jonghee; Lee, Sang Seok; Lee, Changjae; Hugonnet, Herve; Yoon, Dong Ki; Kim, Shin-Hyun; et al, NATURE MATERIALS, v.21, no.3, pp.317 - 324, 2022-03

11
Understanding Strain-Induced Phase Transformations in BiFeO3 Thin Films

Dixit, Hemant; Beekman, Christianne; Schlepuetz, Christian M.; Siemons, Wolter; Yang, Yongsoo; Senabulya, Nancy; Clarke, Roy; et al, ADVANCED SCIENCE, v.2, no.8, pp.1500041, 2015-08

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