광리소그래픽 위상변위마스크용 Si-O-N-F 박막의 모사연구, 증착 과 특성분석Simulation and characterization of silicon oxynitrofluoride films as a phase shift mask material

Cited 0 time in webofscience Cited 0 time in scopus
  • Hit : 365
  • Download : 0
Advisors
노광수researcherNo, Kwang-Sooresearcher
Description
한국과학기술원 : 재료공학과,
Publisher
한국과학기술원
Issue Date
2002
Identifier
174023/325007 / 020003561
Language
kor
Description

학위논문(석사) - 한국과학기술원 : 재료공학과, 2002.2, [ viii, 81 p. ]

Keywords

광리소그래피; 위상변위 마스크; phase shift mask; silicon oxynitrofluoride; optical lithography

URI
http://hdl.handle.net/10203/50887
Link
http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=174023&flag=dissertation
Appears in Collection
MS-Theses_Master(석사논문)
Files in This Item
There are no files associated with this item.

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0