전자빔 손상이 n-MOSFET의 전기적 특성에 미치는 영향 = Effects of electron beam damage on the electrical characteristics of n-MOSFETs

Cited 0 time in webofscience Cited 0 time in scopus
  • Hit : 252
  • Download : 0
Advisors
천성순researcherChun, Soung-Soonresearcher
Description
한국과학기술원 : 재료공학과,
Publisher
한국과학기술원
Issue Date
1994
Identifier
69006/325007 / 000805238
Language
kor
Description

학위논문(박사) - 한국과학기술원 : 재료공학과, 1994.2, [ 96 p. ]

URI
http://hdl.handle.net/10203/50093
Link
http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=69006&flag=dissertation
Appears in Collection
MS-Theses_Ph.D.(박사논문)
Files in This Item
There are no files associated with this item.

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0