DC Field | Value | Language |
---|---|---|
dc.contributor.advisor | 천성순 | - |
dc.contributor.advisor | Chun, Soung-Soon | - |
dc.contributor.author | 전영진 | - |
dc.contributor.author | Jeon, Young-Jin | - |
dc.date.accessioned | 2011-12-15T01:01:32Z | - |
dc.date.available | 2011-12-15T01:01:32Z | - |
dc.date.issued | 1994 | - |
dc.identifier.uri | http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=69006&flag=dissertation | - |
dc.identifier.uri | http://hdl.handle.net/10203/50093 | - |
dc.description | 학위논문(박사) - 한국과학기술원 : 재료공학과, 1994.2, [ 96 p. ] | - |
dc.language | kor | - |
dc.publisher | 한국과학기술원 | - |
dc.title | 전자빔 손상이 n-MOSFET의 전기적 특성에 미치는 영향 | - |
dc.title.alternative | Effects of electron beam damage on the electrical characteristics of n-MOSFETs | - |
dc.type | Thesis(Ph.D) | - |
dc.identifier.CNRN | 69006/325007 | - |
dc.description.department | 한국과학기술원 : 재료공학과, | - |
dc.identifier.uid | 000805238 | - |
dc.contributor.localauthor | 전영진 | - |
dc.contributor.localauthor | Jeon, Young-Jin | - |
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