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High trap density and long retention time from self-assembled amorphous Si nanocluster floating gate nonvolatile memory

Cha, Daigil; Shin, JungHoon; Park, Sangjin; Lee, Eunha; Park, Yoondong; Yoo, In-Kyeong; Seol, Kwang Soo; et al, APPLIED PHYSICS LETTERS, v.89, no.24, pp.443 - 448, 2006-12

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