EE-Journal Papers(저널논문)

Recent Items

Collection's Items (Sorted by Submit Date in Descending order): 3321 to 3340 of 14200

3321
Thin Ion-Gel Dielectric Layer to Enhance the Stability of Polymer Transistors

Lee, Sung Won; Shin, Minkwan; Park, Jae Yoon; Kim, Bong Soo; Tu, Deyu; Jeon, Sanghun; Jeong, Unyong, SCIENCE OF ADVANCED MATERIALS, v.7, no.5, pp.874 - 880, 2015-05

3322
Photoresponse of an oxide semiconductor photosensor

Ahn, Seung-Eon; Park, Sungho; Kim, Taeho; Park, Junghak; Jeon, Sanghun, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.33, no.3, 2015-05

3323
A Sensor Array Using Multifunctional Field-effect Transistors with Ultrahigh Sensitivity and Precision for Bio-monitoring

Kim, Do-Il; Tran Quang Trung; Hwang, Byeong-Ung; Kim, Jin-Su; Jeon, Sanghun; Bae, Jihyun; Park, Jong-Jin; et al, SCIENTIFIC REPORTS, v.5, 2015-07

3324
Fast transient charging behavior of HfInZnO thin-film transistor

Kim, Taeho; Hur, Ji-Hyun; Jeon, Sanghun, APPLIED PHYSICS LETTERS, v.107, no.9, 2015-08

3325
Hot Carrier Trapping Induced Negative Photoconductance in InAs Nanowires toward Novel Nonvolatile Memory

Yang, Yiming; Peng, Xingyue; Kim, Hong-Seok; Kim, Taeho; Jeon, Sanghun; Kang, Hang Kyu; Choi, Wonjun; et al, NANO LETTERS, v.15, no.9, pp.5875 - 5882, 2015-09

3326
Ar plasma treated ZnON transistor for future thin film electronics

Lee, Eunha; Kim, Taeho; Benayad, Anass; Kim, HeeGoo; Jeon, Sanghun; Park, Gyeong-Su, APPLIED PHYSICS LETTERS, v.107, no.12, 2015-09

3327
Oxygen Defect-Induced Metastability in Oxide Semiconductors Probed by Gate Pulse Spectroscopy

Lee, Sungsik; Nathan, Arokia; Jeon, Sanghun; Robertson, John, SCIENTIFIC REPORTS, v.5, 2015-10

3328
A Monte Carlo simulation for bipolar resistive memory switching in large band-gap oxides

Hur, Ji-Hyun; Lee, Dongsoo; Jeon, Sanghun, APPLIED PHYSICS LETTERS, v.107, no.20, 2015-11

3329
Dislocation scatterings in p-type Si1-xGex under weak electric field

Hur, Ji-Hyun; Jeon, Sanghun, NANOTECHNOLOGY, v.26, no.49, 2015-12

3330
III-V compound semiconductors for mass-produced nano-electronics: theoretical studies on mobility degradation by dislocation

Hur, Ji-Hyun; Jeon, Sanghun, SCIENTIFIC REPORTS, v.6, 2016-02

3331
High mobility and high stability glassy metal-oxynitride materials and devices

Lee, Eunha; Kim, Taeho; Benayad, Anass; Hur, Jihyun; Park, Gyeong-Su; Jeon, Sanghun, SCIENTIFIC REPORTS, v.6, 2016-04

3332
Dislocation effects in FinFETs for different III-V compound semiconductors

Hur, Ji-Hyun; Jeon, Sanghun, JOURNAL OF PHYSICS D-APPLIED PHYSICS, v.49, no.15, 2016-04

3333
The influence of interfacial defects on fast charge trapping in nanocrystalline oxide-semiconductor thin film transistors

Kim, Taeho; Hur, Jihyun; Jeon, Sanghun, SEMICONDUCTOR SCIENCE AND TECHNOLOGY, v.31, no.5, 2016-05

3334
Pulse I-V characterization of a nanocrystalline oxide device with sub-gap density of states

Kim, Taeho; Hur, Ji-Hyun; Jeon, Sanghun, NANOTECHNOLOGY, v.27, no.21, 2016-05

3335
Synthesis of freestanding cupric oxide nanotubes with close ends from copper nanowires by the Kirkendall effect

Park, Sungho; Chae, Wonseok; Han, Manso; Jeon, Sanghun, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.34, no.5, 2016-09

3336
Photosensitivity of InZnO thin-film transistors using a solution process

Choi, Jongwon; Park, Junghak; Lim, Keon-Hee; Cho, Nam-kwang; Lee, Jinwon; Jeon, Sanghun; Kim, Youn Sang, APPLIED PHYSICS LETTERS, v.109, no.13, 2016-09

3337
Quantum Simulation Study on Performance Optimization of GaSb/InAs nanowire Tunneling FET

Hur, Ji-Hyun; Jeon, Sanghun, JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.16, no.5, pp.630 - 634, 2016-10

3338
Polymer-Assisted Solution Processing of TiO2 Thin Films for Resistive-Switching Random Access Memory

Vishwanath, Sujaya Kumar; Jeon, Sanghun; Kim, Jihoon, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.164, no.2, pp.H21 - H24, 2017

3339
Influence of Fast Charging on Accuracy of Mobility in a-InHfZnO Thin-Film Transistor

Kim, Taeho; Choi, Rino; Jeon, Sanghun, IEEE ELECTRON DEVICE LETTERS, v.38, no.2, pp.203 - 206, 2017-02

3340
A theoretical modeling of photocurrent generation and decay in layered MoS2 thin-film transistor photosensors

Hur, Ji-Hyun; Park, Junghak; Jeon, Sanghun, JOURNAL OF PHYSICS D-APPLIED PHYSICS, v.50, no.6, 2017-02

Discover

Type

Open Access

Date issued

. next

Subject

. next

rss_1.0 rss_2.0 atom_1.0