미소 기전 시스템용 니켈 박막의 기계적 물성 측정Measurement of mechanical properties of electroplated nickel thin film for MEMS application

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dc.contributor.advisor이순복-
dc.contributor.advisorLee, Soon-Bok-
dc.contributor.author백동천-
dc.contributor.authorBaek, Dong-Cheon-
dc.date.accessioned2011-12-14T06:40:08Z-
dc.date.available2011-12-14T06:40:08Z-
dc.date.issued2003-
dc.identifier.urihttp://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=180105&flag=dissertation-
dc.identifier.urihttp://hdl.handle.net/10203/45412-
dc.description학위논문(석사) - 한국과학기술원 : 기계공학전공, 2003.2, [ vii, 70 p. ]-
dc.languagekor-
dc.publisher한국과학기술원-
dc.subject나노인덴터-
dc.subject니켈-
dc.subject전기도금-
dc.subject기계적 성질-
dc.subject미소 기전 시스템-
dc.subjectMEMS-
dc.subjectnano indenter-
dc.subjectnickel-
dc.subjectelectro plated-
dc.subjectmechanical properties-
dc.title미소 기전 시스템용 니켈 박막의 기계적 물성 측정-
dc.title.alternativeMeasurement of mechanical properties of electroplated nickel thin film for MEMS application-
dc.typeThesis(Master)-
dc.identifier.CNRN180105/325007-
dc.description.department한국과학기술원 : 기계공학전공, -
dc.identifier.uid020013270-
dc.contributor.localauthor백동천-
dc.contributor.localauthorBaek, Dong-Cheon-
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ME-Theses_Master(석사논문)
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