Browse "EE-Journal Papers(저널논문)" by Subject n-well thickness
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| A New Resistance Model for a Schottky Barrier Diode in CMOS Including N-well Thickness Effect Lee, Jaelin; Kim, Suna; Hong, Jong-Phil; Lee, Sang-Gug, JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.13, no.4, pp.381 - 386, 2013-08 |
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