Browse "EE-Journal Papers(저널논문)" by Subject Tungsten (W)
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| Analysis of Fluorine Effects on Charge-Trap Flash Memory of W/TiN/Al2O3/Si3N4/SiO2/Poly-Si Gate Stack Lee, Tae Yoon; Lee, Seung Hwan; Son, Jun Woo; Lee, Sang Jae; Bong, Jae Hoon; Shin, Eui Joong; Kim, Sung Ho; et al, SOLID-STATE ELECTRONICS, v.164, pp.107713, 2020-02 |
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