Browse "EE-Journal Papers(저널논문)" by Subject THICKNESS
Showing results 1 to 14 of 14
| A comparison between leakage currents in thin gate oxides subjected to X-ray radiation and electrical stress degradation Cho, Byung Jin; Kim, SJ; Ling, CH; Joo, MS; Yeo, IS, SOLID-STATE ELECTRONICS, v.44, no.7, pp.1289 - 1292, 2000-07 |
| Analysis of single-layered multiconductor transmission lines using the fourier transform and mode-matching techniques Park, HH; Kwon, JH; Lee, JW; Eom, Hyo Joon, MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, v.36, no.4, pp.315 - 317, 2003-02 |
| ANALYTIC SCATTERING MODEL FOR A DOUBLE SLOTTED CAVITY Choi, Ho-Joong; Eom, Hyo-Joon, JOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS, v.25, no.11-12, pp.1678 - 1687, 2011 |
| Electron mobility enhancement using ultrathin pure Ge on Si substrate Yeo, CC; Cho, Byung Jin; Gao, E; Lee, SJ; Lee, AH; Yu, CY; Liu, CW; et al, IEEE ELECTRON DEVICE LETTERS, v.26, no.10, pp.761 - 763, 2005-10 |
| Endometrium segmentation on transvaginal ultrasound image using key-point discriminator Park, Hyenok; Lee, Hong Joo; Kim, Hak Gu; Ro, Yong Man; Shin, Dongkuk; Lee, Sa Ra; Kim, Sung Hoon; et al, MEDICAL PHYSICS, v.46, no.9, pp.3974 - 3984, 2019-09 |
| Enhancement of the saturation mobility in a ferroelectric-gated field-effect transistor by the surface planarization of ferroelectric film Kim, Woo Young; Jeon, Gwang-Jae; Kang, In-Ku; Shim, Hyun Bin; Lee, Hee Chul, THIN SOLID FILMS, v.591, pp.1 - 7, 2015-09 |
| Insertion of HfO2 Seed/Dielectric Layer to the Ferroelectric HZO Films for Heightened Remanent Polarization in MFM Capacitors Gaddam, Venkateswarlu; Das, Dipjyoti; Jeon, Sanghun, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.67, no.2, pp.745 - 750, 2020-02 |
| Investigation of reliability degradation of ultra-thin gate oxides irradiated under electron-beam lithography conditions Chong, PF; Cho, Byung Jin; Chor, EF; Joo, MS; Yeo, IS, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.39, no.4B, pp.2181 - 2185, 2000-04 |
| ITO-free flexible organic light-emitting diode using ZnS/Ag/MoO3 anode incorporating a quasi-perfect Ag thin film Han, Yun Cheol; Lim, Myung Sub; Park, Jun Hong; Choi, Kyung Cheol, ORGANIC ELECTRONICS, v.14, no.12, pp.3437 - 3443, 2013-12 |
| Leakage current limit of time domain reflectometry in ultrathin dielectric characterization Kim, Yonghun; Baek, Seung Heon; Jeon, Chang Hoon; Lee, Young Gon; Kim, Jin Ju; Jung, Ukjin; Kang, Soo Cheol; et al, JAPANESE JOURNAL OF APPLIED PHYSICS, v.53, no.8, pp.37 - 41, 2014-08 |
| Magnetic polarizability for two circular apertures in parallel conducting planes Park, YB; Eom, Hyo Joon, ELECTROMAGNETICS, v.23, pp.347 - 359, 2003-05 |
| Quantitative mapping of diffusion characteristics under the cortical surface Koo, BB; Choi, K; Ronen, I; Lee, JM; Kim, Dae-Shik, MAGNETIC RESONANCE IMAGING, v.28, no.SI, pp.1175 - 1182, 2010-10 |
| Reliability of thin gate oxides irradiated under X-ray lithography conditions Cho, Byung Jin; Kim, SJ; Ang, CH; Ling, CH; Joo, MS; Yeo, IS, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.40, no.4B, pp.2819 - 2822, 2001-04 |
| Study on Charge-Enhanced Ferroelectric SIS Optical Phase Shifters Utilizing Negative Capacitance Effect Bidenko, Pavlo; Han, Jae-Hoon; Song, Jindong; Kim, Sang Hyeon, IEEE JOURNAL OF QUANTUM ELECTRONICS, v.56, no.6, 2020-12 |
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