Browse "EE-Journal Papers(저널논문)" by Subject HgCdTe
Showing results 1 to 12 of 12
| 1/f noise characteristics of hydrogenated long-wavelength infrared HgCdTe photodiode Yang, KD; Lee, YS; Lee, Hee Chul, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, v.43, pp.L1617 - L1619, 2004-12 |
| A comparison of gamma radiation effects on bromine- and hydrazine-treated HgCdTe photodiodes Lee, MY; Kim, YH; Lee, NH; Lee, Yong Soo; Lee, Hee Chul, JOURNAL OF ELECTRONIC MATERIALS, v.35, pp.1429 - 1433, 2006-06 |
| Analysis of 1/f noise in LWIR HgCdTe photodiodes Bae, SH; Lee, SJ; Kim, YH; Lee, Hee Chul; Kim, Choong Ki, JOURNAL OF ELECTRONIC MATERIALS, v.29, no.6, pp.877 - 882, 2000-06 |
| Bake stability of CdTe and ZnS on HgCdTe: An x-ray photoelectron spectroscopy study Jha, SK; Srivastava, P; Pal, R; Anjali; Sehgal, HK; Lee, Hee Chul; Agnihotri, OP; et al, JOURNAL OF ELECTRONIC MATERIALS, v.32, no.8, pp.899 - 905, 2003-08 |
| Characteristics of gradually doped LWIR diodes by hydrogenation Kim, Y.-H.; Kim, T.-S.; Redfern, D.A.; Musca, C.A.; Lee, Hee Chul; Kim, Choong Ki, JOURNAL OF ELECTRONIC MATERIALS, v.29, no.6, pp.859 - 864, 2000-06 |
| Characterization of the surface recombination velocity of HgCdTe using a gate-controlled diode Choi, JH; Lee, Hee Chul, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.39, no.2B, pp.152 - 155, 2000-02 |
| Effects of hydrazine surface treatment on HgCdTe long-wavelength infrared photodiodes Lee, MY; Lee, YS; Lee, Hee Chul, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS EXPRESS LETTERS, v.44, no.37-41, pp.1252 - 1255, 2005 |
| Enhancement of the steady state minority carrier lifetime in HgCdTe photodiode using ECR plasma hydrogenation Jung, H; Lee, Hee Chul; Kim, Choong Ki, JOURNAL OF ELECTRONIC MATERIALS, v.25, no.8, pp.1266 - 1269, 1996-08 |
| Measurement of the steady-state minority carrier diffusion length in a HgCdTe photodiode Jung, H; Lee, Hee Chul; Kim, CK, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.35, no.10B, pp.1321 - 1323, 1996-10 |
| Photocurrent effect on the zero-bias dynamic resistance of HgCdTe photodiode Kim, K; Jung, H; Shin, H; Lee, Hee Chul; Kim, CK, JOURNAL OF ELECTRONIC MATERIALS, v.26, no.6, pp.662 - 666, 1997-06 |
| Rapid thermal diffusion of indium in p-HgCdTe/CdTe Park, SM; Kim, JM; Lee, Hee Chul; Kim, Choong Ki, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.35, no.12A, pp.1554 - 1557, 1996-12 |
| Surface leakage current analysis of ion implanted ZnS-passivated n-on-p HgCdTe diodes in weak inversion Kim, YH; Bae, SH; Lee, Hee Chul; Kim, CK, JOURNAL OF ELECTRONIC MATERIALS, v.29, no.6, pp.832 - 836, 2000-06 |
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