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Orientations of polycrystalline ZnO at the buried interface of oxide thin film transistors (TFTs): A grazing incidence X-ray diffraction study

Kim, JY; Ko Park, Sang-Hee; Jeong, HY; Park, C; Choi, SY; Choi, JY; Han, SH; et al, BULLETIN OF THE KOREAN CHEMICAL SOCIETY, v.29, no.4, pp.727 - 728, 2008-04

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