DSpace at KOASAS: Orientations of polycrystalline ZnO at the buried interface of oxide thin film transistors (TFTs): A grazing incidence X-ray diffraction study

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Orientations of polycrystalline ZnO at the buried interface of oxide thin film transistors (TFTs): A grazing incidence X-ray diffraction study

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Kim, JY / Ko Park, Sang-Hee researcher / Jeong, HY / Park, C / Choi, SY researcher / Choi, JY / Han, SH / Yoon, TH

Publisher: KOREAN CHEMICAL SOC

Issue Date: 2008-04

Language: English

Article Type: Article

Citation: BULLETIN OF THE KOREAN CHEMICAL SOCIETY, v.29, no.4, pp.727 - 728

ISSN: 0253-2964

URI: http://hdl.handle.net/10203/93192

Appears in Collection: MS-Journal Papers(저널논문)EE-Journal Papers(저널논문)

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Orientations of polycrystalline ZnO at the buried interface of oxide thin film transistors (TFTs): A grazing incidence X-ray diffraction study

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