Browse "EE-Journal Papers(저널논문)" by Author Lee, Seung-Wook
Showing results 1 to 8 of 8
| A Comparative Study on Hot-Carrier Injection in 5-story Vertically Integrated Inversion-Mode and Junctionless-Mode Gate-All-Around MOSFETs Kim, Seong-Yeon; Lee, Byung-Hyun; Hur, Jae; Park, Jun-Young; Jeon, Seung-Bae; Lee, Seung-Wook; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.39, no.1, pp.4 - 7, 2018-01 |
| A Comprehensive Study of a Single-Transistor Latch in Vertical Pillar-Type FETs With Asymmetric Source and Drain Lee, Seung-Wook; Kim, Seong-Yeon; Hwang, Kyu-Man; Jin, Ik Kyeong; Hur, Jae; Kim, Dohyun; Son, Jun Woo; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.65, no.11, pp.5208 - 5212, 2018-11 |
| A Study of High-Temperature Effects on an Asymmetrically Doped Vertical Pillar-Type Field-Effect Transistor Han, Joon-Kyu; Hur, Jae; Kim, Wu-Kang; Park, Jun-Young; Lee, Seung-Wook; Kim, Seong-Yeon; Yu, Ji-Man; et al, IEEE TRANSACTIONS ON NANOTECHNOLOGY, v.19, pp.52 - 55, 2020-01 |
| Comprehensive Study on the Relation Between Low-Frequency Noise and Asymmetric Parasitic Resistances in a Vertical Pillar-Type FET Lee, Seung-Wook; Bang, Tewook; Kim, Choong-Ki; Hwang, Kyu-Man; Jang, Byung Chul; Moon, Dong-Il; Bae, Hagyoul; et al, IEEE ELECTRON DEVICE LETTERS, v.38, no.8, pp.1008 - 1011, 2017-08 |
| Multilevel States of Nano-Electromechanical Switch for a PUF-Based Security Device Hwang, Kyu-Man; Kim, Wu-Kang; Jin, Ik Kyeong; Lee, Seung-Wook; Choi, Yang-Kyu, SMALL, v.15, no.3, 2019-01 |
| Nano-electromechanical Switch Based on a Physical Unclonable Function for Highly Robust and Stable Performance in Harsh Environments Hwang, Kyu-Man; Park, Jun-Young; Bae, Hagyoul; Lee, Seung-Wook; Kim, Choong-Ki; Seo, Myungsoo; Im, Hwon; et al, ACS NANO, v.11, no.12, pp.12547 - 12552, 2017-12 |
| Quantitative Analysis of Deuterium Annealing Effect on Poly-Si TFTs by Low Frequency Noise and DC I-V Characterization Kim, Dohyun; Lim, Sung Kwan; Bae, Hagyoul; Kim, Choong-Ki; Lee, Seung-Wook; Seo, Myungsoo; Kim, Seong-Yeon; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.65, no.4, pp.1640 - 1644, 2018-04 |
| Self-powered data erasing of nanoscale flash memory by triboelectricity Jin, Ik Kyeong; Park, Jun-Young; Lee, Byung-Hyun; Jeon, Seung-Bae; Tcho, Il-Woong; Park, Sang-Jae; Kim, Weon-Guk; et al, NANO ENERGY, v.52, pp.63 - 70, 2018-10 |
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