Showing results 1 to 4 of 4
Dependence of Grain Size on the Performance of a Polysilicon Channel TFT for 3D NAND Flash Memory Kim, Seung-Yoon; Park, Jong-Kyung; Hwang, Wan Sik; Lee, Seung-Jun; Lee, Ki-Hong; Pyi, Seung Ho; Cho, Byung-Jin, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.16, no.5, pp.5044 - 5048, 2016-05 |
INVESTIGATION ON THE ELECTRICAL CONTACT BEHAVIORS OF RF MEMS SWITCHES USING NANO-INDENTER Kim, Dong-Seok; Ko, Seung-Deok; Lee, Seung-Jun; Lee, Byung-Kee; Yoon, Jun-Bo; Kim, Do-Kyung, REVIEWS ON ADVANCED MATERIALS SCIENCE, v.28, no.1, pp.17 - 20, 2011-06 |
Monolithically 3-D Integrated Nanoelectromechanical (NEM) Configuration Memory for CMOS-NEM Hybrid Demultiplexer Kim, Tae-Soo; Lee, Yong-Bok; Kim, Sung-Ho; Lee, So-Young; Lee, Seung-Jun; Yoon, Jun-Bo, IEEE ELECTRON DEVICE LETTERS, v.44, no.12, pp.2055 - 2058, 2023-12 |
Wafer-Scale CMOS-Compatible Electro-Thermally Actuated Nanomechanical Non-Volatile Switch with Out-of-Plane Electrode Configuration Lee, Yong-Bok; Choi, Pan-Hyu; Kang, Min-Ho; Kim Su-Hyun; Lee, Seung-Jun; KIm, Tae-Soo; Lee, So-Young; et al, Advanced Electron Materials, 2024-04 |
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