Browse "EE-Journal Papers(저널논문)" by Author Lee, Myung Keun
Showing results 1 to 8 of 8
| Electro-Thermal Annealing Method for Recovery of Cyclic Bending Stress in Flexible a-IGZO TFTs Lee, Myung Keun; Kim, Choong-Ki; Park, Jeong Woo; Kim, Eungtaek; Seol, Myeong-Lok; Park, Jun-Young; Choi, Yang-Kyu; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.64, no.8, pp.3189 - 3192, 2017-08 |
| Electrothermal Annealing (ETA) Method to Enhance the Electrical Performance of Amorphous-Oxide-Semiconductor (AOS) Thin-Film Transistors (TFTs) Kim, Choong-Ki; Kim, Eungtaek; Lee, Myung Keun; Park, Jun-Young; Seol, Myeong-Lok; Bae, Hagyoul; Bang, Tewook; et al, ACS APPLIED MATERIALS & INTERFACES, v.8, no.36, pp.23820 - 23826, 2016-09 |
| Highly Conductive Transparent and Flexible Electrodes Including Double-Stacked Thin Metal Films for Transparent Flexible Electronics Han, Jun Hee; Kim, Do-Hong; Jeong, Eun Gyo; Lee, TaeWoo; Lee, Myung Keun; Park, Jeong Woo; Lee, Hoseung; et al, ACS APPLIED MATERIALS INTERFACES, v.9, no.19, pp.16343 - 16350, 2017-05 |
| Highly stable 2D material (2DM) field-effect transistors (FETs) with wafer-scale multidyad encapsulation Kim, Choong-Ki; Jeong, Eun Gyo; Kim, Eungtaek; Song, Jeong-Gyu; Kim, Youngjun; Woo, Whang Je; Lee, Myung Keun; et al, NANOTECHNOLOGY, v.28, no.5, 2017-02 |
| Influence of the charge trap density distribution in a gate insulator on the positive-bias stress instability of amorphous indium-gallium-zinc oxide thin-film transistors Kim, Eungtaek; Kim, Choong-Ki; Lee, Myung Keun; Bang, Tewook; Choi, Yang-Kyu; Park, Sang-Hee Ko; Choi, Kyung Cheol, APPLIED PHYSICS LETTERS, v.108, no.18, 2016-05 |
| Low-Resistive High-Work-Function Gate Electrode for Transparent a-IGZO TFTs Jang, Woo Jae; Lee, Myung Keun; Yoo, Jinhan; Kim, Eungtaek; Yang, Dae Young; Park, Junhong; Park, Jeong Woo; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.64, no.1, pp.164 - 169, 2017-01 |
| Low-Temperature Fabrication of Robust, Transparent, and Flexible Thin-Film Transistors with a Nanolaminated Insulator Kwon, Jeong Hyun; Park, Junhong; Lee, Myung Keun; Park, Jeong Woo; Jeon, Yongmin; Shin, Jeong Bin; Nam, Minwoo; et al, ACS APPLIED MATERIALS & INTERFACES, v.10, no.18, pp.15829 - 15840, 2018-05 |
| Suppressed Instability of a-IGZO Thin-Film Transistors Under Negative Bias Illumination Stress Using the Distributed Bragg Reflectors Kim, Eung Taek; Jang, Woo jae; Kim, Woohyun; Park, Junhong; Lee, Myung Keun; Park, Sang-Hee Ko; Choi, Kyung Cheol, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.63, no.3, pp.1066 - 1071, 2016-03 |
Discover
Open Access
- 573 OA Article
Date issued
- 1,837 2020 - 2024
- 5,085 2010 - 2019
- 4,213 2000 - 2009
- 2,379 1990 - 1999
- 665 1980 - 1989