Browse "EE-Journal Papers(저널논문)" by Author Kim, Sangwook
Showing results 1 to 5 of 5
| Instability in threshold voltage and subthreshold behavior in Hf-In-Zn-O thin film transistors induced by bias-and light-stress Ghaffarzadeh, Khashayar; Nathan, Arokia; Robertson, John; Kim, Sangwook; Jeon, Sanghun; Kim, Changjung; Chung, U-In; et al, APPLIED PHYSICS LETTERS, v.97, no.11, 2010-09 |
| Low-Frequency Noise Performance of a Bilayer InZnO-InGaZnO Thin-Film Transistor for Analog Device Applications Jeon, Sanghun; Kim, Sun Il; Park, Sungho; Song, Ihun; Park, Jaechul; Kim, Sangwook; Kim, Changjung, IEEE ELECTRON DEVICE LETTERS, v.31, no.10, pp.1128 - 1130, 2010-10 |
| Nanometer-Scale Oxide Thin Film Transistor with Potential for High-Density Image Sensor Applications Jeon, Sanghun; Park, Sungho; Song, Ihun; Hur, Ji-Hyun; Park, Jaechul; Kim, Hojung; Kim, Sunil; et al, ACS APPLIED MATERIALS & INTERFACES, v.3, no.1, pp.1 - 6, 2011-01 |
| Persistent photoconductivity in Hf-In-Zn-O thin film transistors Ghaffarzadeh, Khashayar; Nathan, Arokia; Robertson, John; Kim, Sangwook; Jeon, Sanghun; Kim, Changjung; Chung, U-In; et al, APPLIED PHYSICS LETTERS, v.97, no.14, 2010-10 |
| The influence of visible light on the gate bias instability of In-Ga-Zn-O thin film transistors Kim, Sangwook; Kim, Sunil; Kim, Changjung; Park, JaeChul; Song, Ihun; Jeon, Sanghun; Ahn, Seung-Eon; et al, SOLID-STATE ELECTRONICS, v.62, no.1, pp.77 - 81, 2011-08 |
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