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Browse "EE-Journal Papers(저널논문)" by Author Kim, Sang-Hyeon

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Showing results 1 to 8 of 8

1	An Investigation of HZO-Based n/p-FeFET Operation Mechanism and Improved Device Performance by the Electron Detrapping Mode Kuk, Song-Hyeon; Han, Seung-Min; Kim, Bong Ho; Baek, Seung-Hyub; Han, Jae-Hoon; Kim, Sang-Hyeon, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.69, no.4, pp.2080 - 2087, 2022-04
2	Epitaxial Lift-Off Technology for Large Size III-V-on-Insulator Substrate Lee, Subin; Kim, Seongkwang; Han, Jae-Hoon; Song, Jin Dong; Jun, Dong-Hwan; Kim, Sang-Hyeon, IEEE ELECTRON DEVICE LETTERS, v.40, no.11, pp.1732 - 1735, 2019-11
3	Examination of Ferroelectric FET for "Cold" Nonvolatile Memory Kuk, Song-Hyeon; Han, Seung-Min; Kim, Bong Ho; Kim, Joon Pyo; Kim, Seong-Kwang; Ahn, Seung-Yeop; Park, Min Hyuk; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.70, no.8, pp.4122 - 4127, 2023-08
4	High Hole Mobility and Low Leakage Thin-Body (In)GaSb p-MOSFETs Grown on High-Bandgap AlGaSb Kim, Sang-Hyeon; Roh, Ilpyo; Han, Jae-Hoon; Geum, Dae-Myeong; Kim, Seong Kwang; Kang, Soo Seok; Kang, Hang-Kyu; et al, IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, v.9, pp.42 - 48, 2021
5	Memory window enhancement in n-type ferroelectric field-effect transistors by engineering ozone exposure in atomic layer deposition of HfZrOx films Jeon, Jihoon; Kuk, Song-Hyeon; Cho, Ah-Jin; Baek, Seung-Hyub; Kim, Sang-Hyeon; Kim, Seong Keun, APPLIED PHYSICS LETTERS, v.122, no.23, 2023-06
6	Mnemonic-Opto-Synaptic Transistor for In-sensor Vision System Han, Joon-Kyu; Chung, Young-Woo; Sim, Jaeho; Yu, Ji-Man; Lee, Geon-Beom; Kim, Sang-Hyeon; Choi, Yang-Kyu, SCIENTIFIC REPORTS, v.12, no.1, 2022-02
7	Monolithic 3D Integration of InGaAs Photodetectors on Si MOSFETs Using Sequential Fabrication Process Geum, Dae-Myeong; Kim, Seong Kwang; Lee, Subin; Lim, Donghwan; Kim, Hyung-Jun; Choi, Chang Hwan; Kim, Sang-Hyeon, IEEE ELECTRON DEVICE LETTERS, v.41, no.3, pp.433 - 436, 2020-03
8	Photo-Responsible Synapse Using Ge Synaptic Transistors and GaAs Photodetectors Kim, Seong Kwang; Geum, Dae-Myeong; Lim, Hyeong-Rak; Han, JaeHoon; Kim, Hyungjun; Jeong, YeonJoo; Kim, Sang-Hyeon, IEEE ELECTRON DEVICE LETTERS, v.41, no.4, pp.605 - 608, 2020-04

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