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Effects of Si/SiO2 interface stress on the performance of ultra-thin-body field effect transistors: A first-principles study Jung, Hyo Eun; Shin, Mincheol, NANOTECHNOLOGY, v.29, no.2, 2018-01 |
Surface roughness scattering effects on the ballisticity of Schottky barrier nanowire field effect transistors Jung, Hyo Eun; Shin, Mincheol, JOURNAL OF APPLIED PHYSICS, v.118, no.19, pp.195703-1 - 195703-7, 2015-11 |
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