Browse "EE-Journal Papers(저널논문)" by Author Lee, Hee-Chul
Showing results 16 to 33 of 33
| Nanoscale domain growth dynamics of ferroelectric poly(vinylidene fluoride-co-trifluoroethylene) thin films Kim, Yun-Seok; Kim, Woo-Young; Choi, Hyun-Woo; Hong, Daniel Seungbum; Ko, Hyung-Soo; Lee, Hee-Chul; No, Kwang-Soo, APPLIED PHYSICS LETTERS, v.96, no.1, 2010-01 |
| New selective two-step anodization of porous anodic alumina for thin-film encapsulation Jeon, Gwang-Jae; Kim, Woo-Young; Lee, Hee-Chul, MICROELECTRONIC ENGINEERING, v.103, pp.99 - 105, 2013-03 |
| Nickel vacancy behavior in the electrical conductance of nonstoichiometric nickel oxide film Kim, Dong-Soo; Lee, Hee-Chul, JOURNAL OF APPLIED PHYSICS, v.112, no.3, 2012-08 |
| Observation of Irreversible Current Path in Polymer Dielectric using Conductive Atomic Force Microscope Jung, Ji-Hoon; Kim, Woo Young; Kim, Do-Kyung; Kwon, Jin-Hyuk; Lee, Hee-Chul; Bae, Jin-Hyuk, ELECTRONIC MATERIALS LETTERS, v.11, no.2, pp.246 - 251, 2015-03 |
| Oxygen partial pressure and thermal annealing dependent properties of RF magnetron sputtered TiO2-x films Reddy, Y. Ashok Kumar; Kang, In-ku; Shin, Young Bong; Lee, Hee-Chul; Reddy, P. Sreedhara, MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, v.32, pp.107 - 116, 2015-04 |
| Passivation Effect for the Reduction of 1/f Noise in Poly(3,4-ethylenedioxythiophene):Poly(styrene sulfonate) Thin Films Based on Uncooled Type Microbolometer Applications Son, Hyeok-Jun; Kwon, Il-Woong; Lee, Hee-Chul, APPLIED PHYSICS EXPRESS, v.2, 2009-04 |
| Patterning of ferroelectric poly(vinylidene fluoride-trifluoroethylene) film for nonvolatile memory devices Kim, Woo-Young; Lee, Hee-Chul; Ka, Du-Youn; Kwon, Il-Woong; Kim, Dong-Soo; Lee, Yong-Soo; Kim, Sang-Youl, CURRENT APPLIED PHYSICS, v.11, no.3, pp.341 - 344, 2011-05 |
| Poly(3,4-Ethylenedioxythiophene): Poly(Styrenesulfonate) (PEDOT:PSS) Films for the Microbolometer Applications Son, Hyeok-Jun; Kwon, Il-Woong; Lee, Yong-Soo; Lee, Hee-Chul, IEICE TRANSACTIONS ON ELECTRONICS, v.E92C, pp.702 - 707, 2009-05 |
| Resonant cavity integrated absorber structure for capacitive infrared detectors Kwon, Il-Woong; Kim, Dong-Soo; Kim, Woo-Young; Hwang, Chi-Ho; Lee, Hee-Chul, ELECTRONICS LETTERS, v.47, no.8, pp.497 - 499, 2011-04 |
| Retention Performance of Ferroelectric Polymer Film for Nonvolatile Memory Devices Kim, Woo-Young; Ka, Du-Youn; Cho, Byeong-Ok; Kim, Sang-Youl; Lee, Yong-Soo; Lee, Hee-Chul, IEEE ELECTRON DEVICE LETTERS, v.30, no.8, pp.822 - 824, 2009-08 |
| Solvent-Tolerant Patterning of Poly(3-hexylthiophene) Film by Subtractive Photolithography Kim, Woo Young; Lee, Won-Yong; Jeon, Gwang-Jae; Shim, Hyun-Bin; Kang, In-Ku; Kim, Jae-Hyun; Park, Gyung-Tae; et al, MOLECULAR CRYSTALS AND LIQUID CRYSTALS, v.599, no.1, pp.36 - 42, 2014-08 |
| SrBi2Ta2O9/insulator/Si structure for metal/ferroelectric/insulators/Si (MFIS) in an NDRO-type ferroelectric random access memory Lee, WJ; Yu, BG; Lyu, JS; Lee, JH; Kim, BW; Shin, CH; Lee, Hee-Chul, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.35, pp.S509 - S512, 1999-07 |
| Stable Ferroelectric Poly(Vinylidene Fluoride-Trifluoroethylene) Film for Flexible Nonvolatile Memory Application Kim, Woo-Young; Lee, Hee-Chul, IEEE ELECTRON DEVICE LETTERS, v.33, no.2, pp.260 - 262, 2012-02 |
| Surface treatment method for 1/f noise suppression in reactively sputtered nickel oxide film Kim, Dong-Soo; Park, Seung-Man; Lee, Hee-Chul, JOURNAL OF APPLIED PHYSICS, v.112, no.2, 2012-07 |
| TEC-Less ROIC With Self-Bias Equalization for Microbolometer FPA Jo, Young Min; Woo, Doo Hyung; Lee, Hee-Chul, IEEE SENSORS JOURNAL, v.15, no.1, pp.82 - 88, 2015-01 |
| The bolometric characteristic of thermally oxidized thin nickel film for an uncooled infrared image sensor Kim, Dong-Soo; Kwon, Il-Woong; Lee, Yong-Soo; Lee, Hee-Chul, INFRARED PHYSICS TECHNOLOGY, v.54, no.1, pp.10 - 12, 2011-01 |
| Thermistor behavior of PEDOT:PSS thin film Kwon, Il-Woong; Son, Hyuck-Jun; Kim, Woo-Young; Lee, Yong-Soo; Lee, Hee-Chul, SYNTHETIC METALS, v.159, no.12, pp.1174 - 1177, 2009-06 |
| 고유전(Ba,Sr)TiO3 박막 캐패시터의 저전계 영역에서의 전기전도기구 Lee, Hee-Chul; Jang, Hoon; Jang, Byung-Tak; Cha, Seon-Yong, 전자공학회논문지D, v.36, no.6, pp.44 - 51, 1999-06 |
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