Showing results 4 to 14 of 14
Comprehensive Analysis of Gate-Induced Drain Leakage in Vertically Stacked Nanowire FETs: Inversion-Mode Versus Junctionless Mode Hur, Jae; Lee, Byung-Hyun; Kang, Min-Ho; Ahn, Dae-Chul; Bang, Tewook; Jeon, Seung-Bae; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.37, no.5, pp.541 - 544, 2016-05 |
Effect of Annealing Temperature on Minimum Domain Size of Ferroelectric Hafnia Yun, Seokjung; Kim, Hoon; Seo, Myungsoo; Kang, Min-Ho; Kim, Taeho; Cho, Seongwoo; Park, Ming Hyuk; et al, ACS APPLIED ELECTRONIC MATERIALS, v.6, no.4, pp.2134 - 2141, 2024-03 |
Impact of crystalline damage on a vertically integrated junctionless nanowire transistor Ahn, Dae-Chul; Lee, Byung-Hyun; Kang, Min-Ho; Hur, Jae; Bang, Tewook; Choi, Yang-Kyu, APPLIED PHYSICS LETTERS, v.109, no.18, 2016-10 |
Low-Frequency Noise Characteristics in SONOS Flash Memory With Vertically Stacked Nanowire FETs Bang, Te-Wook; Lee, Byung-Hyun; Kim, Choong-Ki; Ahn, Dae-Chul; Jeon, Seung-Bae; Kang, Min-Ho; Oh, Jae-Sub; et al, IEEE ELECTRON DEVICE LETTERS, v.38, no.1, pp.40 - 43, 2017-01 |
Nanomechanical Encoding Method Using Enhanced Thermal Concentration on a Metallic Nanobridge Lee, Jeong-Oen; Choi, Kwang-Wook; Choi, Seon-Jin; Kang, Min-Ho; Seo, Min-Ho; Kim, Il-Doo; Yu, Kyoungsik; et al, ACS NANO, v.11, no.8, pp.7781 - 7789, 2017-08 |
Sub-10 fJ/bit radiation-hard nanoelectromechanical non-volatile memory Lee, Yong-Bok; Kang, Min-Ho; Choi, Pan-Kyu; Kim, Su-Hyun; Kim, Tae-Soo; Lee, So-Young; Yoon, Jun-Bo, NATURE COMMUNICATIONS, v.14, no.1, 2023-01 |
Three-Dimensional Fin-Structured Semiconducting Carbon Nanotube Network Transistor Lee, Dong-Il; Lee, Byung-Hyun; Yoon, Jinsu; Ahn, Dae-Chul; Park, Jun-Young; Hur, Jae; Kim, Myung-Su; et al, ACS NANO, v.10, no.12, pp.10894 - 10900, 2016-12 |
Vertically Integrated Nanowire-Based Unified Memory Lee, Byung-Hyun; Ahn, Dae-Chul; Kang, Min-Ho; Jeon, Seung-Bae; Choi, Yang-Kyu, NANO LETTERS, v.16, no.9, pp.5909 - 5916, 2016-09 |
Vertically Integrated Nanowire-Based Zero-Capacitor Dynamic Random Access Memory![]() Lee, Byung-Hyun; Kang, Min-Ho; Ahn, Dae-Chul; Choi, Yang-Kyu, ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, v.6, no.1, pp.Q1 - Q5, 2017 |
Wafer-Scale CMOS-Compatible Electro-Thermally Actuated Nanomechanical Non-Volatile Switch with Out-of-Plane Electrode Configuration Lee, Yong-Bok; Choi, Pan-Hyu; Kang, Min-Ho; Kim Su-Hyun; Lee, Seung-Jun; KIm, Tae-Soo; Lee, So-Young; et al, Advanced Electron Materials, 2024-04 |
동적 파장 할당 기법을 이용한 광 버스트 스위칭 네트워크에서의 절대적 QoS 제공 Kang, Min-Ho; Kim, Sung-Chang; Choi, Jin-Seek, 전자공학회논문지 - TC, v.40, no.10, pp.8 - 15, 2003-10 |
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