Browse "EE-Journal Papers(저널논문)" by Title
Showing results 4061 to 4080 of 14221
| Coordinated Beamforming with Reduced Overhead for the Downlink of Multiuser MIMO Systems Kim, EY; Chun, Joohwan, IEEE COMMUNICATIONS LETTERS, v.12, pp.810 - 812, 2008-11 |
| Coordinated Beamforming With Relaxed Zero Forcing: The Sequential Orthogonal Projection Combining Method and Rate Control Park, Ju-Ho; Lee, Gil-Won; Sung, Young-Chul; Yukawa, Masahiro, IEEE TRANSACTIONS ON SIGNAL PROCESSING, v.61, no.12, pp.3100 - 3112, 2013-06 |
| Coordinated Beamforming, Interference-Aware Power Control, and Scheduling Framework for 6G Wireless Networks Kim, Yongjae; Jung, Bang Chul; Han, Youngnam, JOURNAL OF COMMUNICATIONS AND NETWORKS, v.24, no.3, pp.292 - 304, 2022-06 |
| Coordinated resource allocation scheme in the forward link of sectorized CDMA systems Seung Sik CHO; Cho, Dong-Ho, IEICE TRANSACTIONS ON COMMUNICATIONS, v.E86B, no.5, pp.1689 - 1693, 2003-05 |
| Coordination of wavelength and time-window assignment in WDM-based TDM hybrid-PONs Kim, NamUk; Kim, TaeYeon; Lee, SeungJin; Kang, Min Ho, PHOTONIC NETWORK COMMUNICATIONS, v.16, no.2, pp.139 - 147, 2008-10 |
| COP: a new corner detector Bae, SC; Kweon, In-So; Yoo, CD, PATTERN RECOGNITION LETTERS, v.23, no.11, pp.1349 - 1360, 2002-09 |
| COP: A New Method for Extracting Edges and Corners Bae, Sun Cheol; Kweon, In-So, IMAGE ANALYSIS AND PROCESSING, 1997 |
| Coplanar waveguides on silicon substrate with thick oxidized porous silicon (OPS) layer Nam, Choong-Mo; Kwon, Young-Se, IEEE Microwave and Guided Wave Letters, v.8, no.11, pp.369 - 371, 1998-11 |
| Copolymer-Based Flexible Resistive Random Access Memory Prepared by Initiated Chemical Vapor Deposition Process Jeong, Jaejoong; Kim, Min Ju; Hwang, Wan Sik; Cho, Byung Jin, ADVANCED ELECTRONIC MATERIALS, v.7, no.10, pp.2100375, 2021-10 |
| Copper nanorod array assisted silicon waveguide polarization beam splitter Kim, Sangsik; Qi, Minghao, OPTICS EXPRESS, v.22, no.8, pp.9508 - 9516, 2014-04 |
| Copy-on-Write with Adaptive Differential Logging for Persistent Memory Hwang, Taeho; Won, Youjip, IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, v.E102D, no.12, pp.2451 - 2460, 2019-12 |
| Coreless Transmitting Coils with Conductive Magnetic Shield for Wide-Range Ubiquitous IPT Choi, Byeung Guk; Sohn, Young-Hoon; Lee, Eun S.; Han, Seung H.; Kim, Hoi-Rin; Rim, Chun Taek, IEEE TRANSACTIONS ON POWER ELECTRONICS, v.34, no.3, pp.2539 - 2552, 2019-03 |
| COREUNITY IMPLEMENTATION ON HYPERCUBE MULTICOMPUTERS WOO, JH; CHO, SY; Park, Kyu Ho, JOURNAL OF PROGRAMMING LANGUAGES, v.2, no.2, pp.125 - 148, 1994-06 |
| CorLayer: A Transparent Link Correlation Layer for Energy-Efficient Broadcast Wang, Shuai; Kim, Song Min; Liu, Yunhuai; Tan, Guang; He, Tian, IEEE-ACM TRANSACTIONS ON NETWORKING, v.23, no.6, pp.1970 - 1983, 2015-12 |
| Correction of Spatially Varying Image and Video Motion Blur Using a Hybrid Camera Tai, Yu-Wing; Du, H; Brown, MS; Lin, S, IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, v.32, pp.1012 - 1028, 2010-06 |
| Correlation analysis of two Skewed Dipoles using embedded beam patterns Han, J.-H.; Myung, Noh-Hoon, Progress In Electromagnetics Research C, v.86, pp.137 - 152, 2018 |
| Correlation between interface traps and gate oxide leakage current in the direct tunneling regime Loh, WY; Cho, Byung Jin; Li, MF, APPLIED PHYSICS LETTERS, v.81, no.2, pp.379 - 381, 2002-07 |
| Correlation between optical properties and Si nanocrystal formation of Si-rich Si oxide films prepared by plasma-enhanced chemical vapor deposition Chen, X. Y.; Lu, Y. F.; Wu, Y. H.; Cho, Byung Jin; Tang, L. J.; Lu, D.; Dong, J. R., APPLIED SURFACE SCIENCE, v.253, no.5, pp.2718 - 2726, 2006-12 |
| Correlation of the vector diffraction effect on the optical lithographic image of a binary mask with magnification of the projection system Jhun, Y; Kim, S; Lee, S; Chung, HB; Yoo, Hyung Joun, APPLIED OPTICS, v.37, no.13, pp.2542 - 2549, 1998-05 |
Correlation-based OTDR for in-service monitoring of 64-split TDM PON Shim, Hyun-Kyu; Cho, Keun-Yeong; Takushima, Y.; Chung, Yun-Chur, OPTICS EXPRESS, v.20, no.5, pp.4921 - 4926, 2012-02 |
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