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Unizxial Stress Dependent I-V Characteristics of GaAs-AlxGa1-xGaAs Single Tunnel Barrier at 77K Lee, Kwyro; Lu, S.S.; Nathan, M.I.; Heiblum, M.; Wright, S.L., Proc. of 4th Int. Conf. on Modulation Doped Semiconductor Structures, pp.671 - 676, 1989 |
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