Showing results 1 to 4 of 4
AIM-Spice FET Device Models : New Device Modeling Approach in VLSI Era Lee, Kwyro; Kim, S.H.; Moon, K.S.; Fjeldly, T.A.; Min, K.-S.; Hong, S.-W.; Shur, M.S., Proc. Int. Sym. on Signals, Systems, and Electronics, pp.615 - 619, 1992 |
Compact MOSFET modeling for harmonic distortion analysis Iniguez, B.; Picos, R.; Kweon, In-So; Shur, M.S.; Fjeldly, T.A.; Lee, K., 5th IEEE International Caracas Conference on Devices, Circuits and Systems, ICCDCS, pp.111 - 117, 2004-11-03 |
Modeling of Current Degradation in Hot-Eletron Damaged LDD NMOSFETs Ytterdal, T.; Kim, S-H.; Min, K-S.; Lee, Kwyro; Fjeldly, T.A., 2nd Int. Device Reseach Symposium, pp.261 - 264, 2nd Int. Device Reseach Symposium, 1993-12 |
Speed and Convergence Properties of Improved MOSFET Models Included in the Circuit Simulator AIM-Spice Lee, Kwyro; Ytterdal, T.; Fjeldly, T.A.; Shur, M., Proc. of 2nd Int. Device Reseach Symposium, pp.345 - 348, 1993 |
Discover