Modeling of Current Degradation in Hot-Eletron Damaged LDD NMOSFETs

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Publisher
2nd Int. Device Reseach Symposium
Issue Date
1993-12
Language
ENG
Citation

2nd Int. Device Reseach Symposium, pp.261 - 264

URI
http://hdl.handle.net/10203/21410
Appears in Collection
EE-Conference Papers(학술회의논문)

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