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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

Modeling of Current Degradation in Hot-Eletron Damaged LDD NMOSFETs

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dc.contributor.authorYtterdal, T.-
dc.contributor.authorKim, S-H.-
dc.contributor.authorMin, K-S.-
dc.contributor.authorLee, Kwyro-
dc.contributor.authorFjeldly, T.A.-
dc.date.accessioned2011-01-06T05:11:20Z-
dc.date.available2011-01-06T05:11:20Z-
dc.date.created2012-02-06-
dc.date.issued1993-12-
dc.identifier.citation2nd Int. Device Reseach Symposium, v., no., pp.261 - 264-
dc.identifier.urihttp://hdl.handle.net/10203/21410-
dc.languageENG-
dc.language.isoen_USen
dc.publisher2nd Int. Device Reseach Symposium-
dc.titleModeling of Current Degradation in Hot-Eletron Damaged LDD NMOSFETs-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage261-
dc.citation.endingpage264-
dc.citation.publicationname2nd Int. Device Reseach Symposium-
dc.identifier.conferencecountryFrance-
dc.contributor.localauthorLee, Kwyro-
dc.contributor.nonIdAuthorYtterdal, T.-
dc.contributor.nonIdAuthorKim, S-H.-
dc.contributor.nonIdAuthorMin, K-S.-
dc.contributor.nonIdAuthorFjeldly, T.A.-
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EE-Conference Papers(학술회의논문)

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