Showing results 1 to 7 of 7
A selective upsealiiig method via super-resolution validity measure Choi, Seokeon; Kim, Jonghee; Kim, Changick, 2016 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2016, Institute of Electrical and Electronics Engineers Inc., 2016-10 |
Few-shot Open-set Recognition by Transformation Consistency Jeong, Minki; Choi, Seokeon; Kim, Changick, IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), pp.12561 - 12570, IEEE Conference on Computer Vision and Pattern Recognition, 2021-06-24 |
Just a Few Points Are All You Need for Multi-View Stereo: A Novel Semi-Supervised Learning Method for Multi-View Stereo Kim, Taekyung; Choi, Jaehoon; Choi, Seokeon; Jung, Dongki; Kim, Changick, 18th IEEE/CVF International Conference on Computer Vision (ICCV), pp.6178 - 6186, IEEE, 2021-10 |
Meta Batch-Instance Normalization for Generalizable Person Re-Identification Choi, Seokeon; Kim, Taekyung; Jeong, Minki; Park, Hyoungseob; Kim, Changick, IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), pp.3424 - 3434, IEEE Conference on Computer Vision and Pattern Recognition, 2021-06-22 |
MobileHumanPose: Toward Real-Time 3D Human Pose Estimation in Mobile Devices Choi, Sangbum; Choi, Seokeon; Kim, Changick, IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, pp.2328 - 2338, IEEE Conference on Computer Vision and Pattern Recognition, 2021-06 |
Robust Template Matching Using Scale-Adaptive Deep Convolutional Features Kim, Jonghee; Kim, Jinsu; Choi, Seokeon; Hasan, Muhammad; Kim, Chang-Ick, 9th Annual Summit and Conference of the Asia-Pacific-Signal-and-Information-Processing-Association (APSIPA ASC), pp.708 - 711, Asia-Pacific Signal and Information Processing Association(APSIPA), 2017-12-14 |
RPM-Net: Robust Pixel-Level Matching Networks for Self-Supervised Video Object Segmentation Kim, Youngeun; Choi, Seokeon; Lee, Hankyeol; Kim, Taekyung; Kim, Changick, 2020 IEEE/CVF Winter Conference on Applications of Computer Vision, WACV 2020, pp.2046 - 2054, Institute of Electrical and Electronics Engineers Inc., 2020-03-02 |
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