A selective upsealiiig method via super-resolution validity measure

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In this paper, we propose a selective upscaling method which applies either super-resolution or bicubic interpolation according to region characteristics for reducing computational complexity\ In order to divide into the two regions, we measure super-resolution validity scores in each local patch. We train Random forests as a regression model for estimating the super-resolution validity score by using three feature vectors, such as gradient magnitude, image residual, and weighted sum ofDCT coefficients. Experimental results show that the selective upscaling method reduces processing time while maintaining quantitative performance in comparison with state-of-The-Art SR methods.
Publisher
Institute of Electrical and Electronics Engineers Inc.
Issue Date
2016-10
Language
English
Citation

2016 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2016

DOI
10.1109/ICCE-Asia.2016.7804787
URI
http://hdl.handle.net/10203/310325
Appears in Collection
EE-Conference Papers(학술회의논문)
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