DC Field | Value | Language |
---|---|---|
dc.contributor.author | Choi, Seokeon | ko |
dc.contributor.author | Kim, Jonghee | ko |
dc.contributor.author | Kim, Changick | ko |
dc.date.accessioned | 2023-07-05T08:00:56Z | - |
dc.date.available | 2023-07-05T08:00:56Z | - |
dc.date.created | 2023-06-08 | - |
dc.date.issued | 2016-10 | - |
dc.identifier.citation | 2016 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2016 | - |
dc.identifier.uri | http://hdl.handle.net/10203/310325 | - |
dc.description.abstract | In this paper, we propose a selective upscaling method which applies either super-resolution or bicubic interpolation according to region characteristics for reducing computational complexity\ In order to divide into the two regions, we measure super-resolution validity scores in each local patch. We train Random forests as a regression model for estimating the super-resolution validity score by using three feature vectors, such as gradient magnitude, image residual, and weighted sum ofDCT coefficients. Experimental results show that the selective upscaling method reduces processing time while maintaining quantitative performance in comparison with state-of-The-Art SR methods. | - |
dc.language | English | - |
dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
dc.title | A selective upsealiiig method via super-resolution validity measure | - |
dc.type | Conference | - |
dc.identifier.scopusid | 2-s2.0-85011052251 | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | 2016 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2016 | - |
dc.identifier.conferencecountry | KO | - |
dc.identifier.conferencelocation | Seoul | - |
dc.identifier.doi | 10.1109/ICCE-Asia.2016.7804787 | - |
dc.contributor.localauthor | Kim, Changick | - |
dc.contributor.nonIdAuthor | Kim, Jonghee | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.