A selective upsealiiig method via super-resolution validity measure

Cited 0 time in webofscience Cited 0 time in scopus
  • Hit : 37
  • Download : 0
DC FieldValueLanguage
dc.contributor.authorChoi, Seokeonko
dc.contributor.authorKim, Jongheeko
dc.contributor.authorKim, Changickko
dc.date.accessioned2023-07-05T08:00:56Z-
dc.date.available2023-07-05T08:00:56Z-
dc.date.created2023-06-08-
dc.date.issued2016-10-
dc.identifier.citation2016 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2016-
dc.identifier.urihttp://hdl.handle.net/10203/310325-
dc.description.abstractIn this paper, we propose a selective upscaling method which applies either super-resolution or bicubic interpolation according to region characteristics for reducing computational complexity\ In order to divide into the two regions, we measure super-resolution validity scores in each local patch. We train Random forests as a regression model for estimating the super-resolution validity score by using three feature vectors, such as gradient magnitude, image residual, and weighted sum ofDCT coefficients. Experimental results show that the selective upscaling method reduces processing time while maintaining quantitative performance in comparison with state-of-The-Art SR methods.-
dc.languageEnglish-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.titleA selective upsealiiig method via super-resolution validity measure-
dc.typeConference-
dc.identifier.scopusid2-s2.0-85011052251-
dc.type.rimsCONF-
dc.citation.publicationname2016 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2016-
dc.identifier.conferencecountryKO-
dc.identifier.conferencelocationSeoul-
dc.identifier.doi10.1109/ICCE-Asia.2016.7804787-
dc.contributor.localauthorKim, Changick-
dc.contributor.nonIdAuthorKim, Jonghee-
Appears in Collection
EE-Conference Papers(학술회의논문)
Files in This Item
There are no files associated with this item.

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0