Browse "EE-Conference Papers(학술회의논문)" by Author Fjeldly, T.A.
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| Modeling of Current Degradation in Hot-Eletron Damaged LDD NMOSFETs Ytterdal, T.; Kim, S-H.; Min, K-S.; Lee, Kwyro; Fjeldly, T.A., 2nd Int. Device Reseach Symposium, pp.261 - 264, 2nd Int. Device Reseach Symposium, 1993-12 |
| Speed and Convergence Properties of Improved MOSFET Models Included in the Circuit Simulator AIM-Spice Lee, Kwyro; Ytterdal, T.; Fjeldly, T.A.; Shur, M., Proc. of 2nd Int. Device Reseach Symposium, pp.345 - 348, 1993 |
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